3 results
A Next Generation Cryo-FIB Microscope for High-Throughput Cryo-Electron Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1250-1251
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
On-the-Fly Image Quality Evaluation for Single-Particle Analysis Cryo-Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 834-835
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
5 - Characterization methods using FIB/SEM DualBeam instrumentation
-
-
- Book:
- Focused Ion Beam Systems
- Published online:
- 12 January 2010
- Print publication:
- 13 September 2007, pp 126-145
-
- Chapter
- Export citation